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On-Chip Detection of Entangled Photons by Scalable Integration of Single-Photon Detectors

机译:基于FpGa的可扩展集成对纠缠光子的片上检测   单光子探测器

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摘要

Photonic integrated circuits (PICs) have emerged as a scalable platform forcomplex quantum technologies using photonic and atomic systems. A central goalhas been to integrate photon-resolving detectors to reduce optical losses,latency, and wiring complexity associated with off-chip detectors.Superconducting nanowire single-photon detectors (SNSPDs) are particularlyattractive because of high detection efficiency, sub-50-ps timing jitter,nanosecond-scale reset time, and sensitivity from the visible to themid-infrared spectrum. However, while single SNSPDs have been incorporated intoindividual waveguides, the system efficiency of multiple SNSPDs in one photoniccircuit has been limited below 0.2% due to low device yield. Here we introducea micrometer-scale flip-chip process that enables scalable integration ofSNSPDs on a range of PICs. Ten low-jitter detectors were integrated on one PICwith 100% device yield. With an average system efficiency beyond 10% formultiple SNSPDs on one PIC, we demonstrate high-fidelity on-chip photoncorrelation measurements of non-classical light.
机译:光子集成电路(PIC)已成为使用光子和原子系统的复杂量子技术的可扩展平台。集成光子分辨探测器以减少与芯片外探测器相关的光损耗,延迟和布线复杂性是一个中心目标。超导纳米线单光子探测器(SNSPD)由于具有高探测效率和低于50ps的定时而特别有吸引力抖动,纳秒级重置时间以及从可见光谱到中红外光谱的灵敏度。然而,尽管将单个SNSPDs合并到单个波导中,但由于器件产量低,一个光子电路中多个SNSPDs的系统效率已被限制在0.2%以下。在这里,我们介绍了一种微米级倒装芯片工艺,该工艺可实现SNSPD在一系列PIC上的可扩展集成。十个低抖动检测器集成在一个PIC上,器件合格率达100%。对于一张PIC上的多个SNSPD,平均系统效率超过10%,我们演示了非经典光的高保真片上光相关测量。

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